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1 article(s) from Sotthewes, Kai

Closed-loop conductance scanning tunneling spectroscopy: demonstrating the equivalence to the open-loop alternative

Chris Hellenthal,
Kai Sotthewes,
Martin H. Siekman,
E. Stefan Kooij and
Harold J. W. Zandvliet

Beilstein J. Nanotechnol. 2015, 6, 1116–1124, doi:10.3762/bjnano.6.113

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Figure 1: Measured and reconstructed dI/dz data obtained from I(z) measurements using three sets of fit param...

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Figure 2: Measured and reconstructed I(z) data. The reconstructed traces were based on the fit parameters fro...

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Figure 3: Logarithmic conductance versus tip-sample distance for measured and reconstructed I(z) data. The re...

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Figure 4: Measured and reconstructed dz/dV traces obtained from z(V) measurements by using three sets of fit ...

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Figure 5: Logarithmic conductance versus tip-sample distance for measured and reconstructed z(V) data. The re...

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Figure 6: Combined logarithmic conductance versus tip–sample distance for z(V) and I(z) measurements. Logarit...

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Figure 7: Measured and reconstructed dI/dz data obtained from I(z) measurements for γ = 0.5. The masking effe...

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Figure 8: Measured and reconstructed dz/dV traces obtained from z(V) measurements for γ=0.5. The masking effe...

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Published 06 May 2015

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